SN74LVT18512DGGR

3.3 -V ABT扫描测试了18位通用总线收发器器件 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS

description

The ’LVT18512 and ’LVT182512 scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port TAP interface.

Additionally, these devices are designed specifically for low-voltage 3.3-V VCC operation, but with the capability to provide a TTL interface to a 5-V system environment.

• Members of the Texas Instruments SCOPE™ Family of Testability Products

• Members of the Texas Instruments Widebus™ Family

• State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation 5-V Input and Output Voltages With 3.3-V VCC

• Support Unregulated Battery Operation Down to 2.7 V

• UBT™ Universal Bus Transceiver Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode

• B-Port Outputs of ’LVT182512 Devices Have Equivalent 25-Ω Series Resistors, So No External Resistors Are Required

• Compatible With the IEEE Std 1149.1-1990 JTAG Test Access Port and Boundary-Scan Architecture

• SCOPE™ Instruction Set

   – IEEE Std 1149.1-1990 Required Instructions and Optional CLAMP and HIGHZ

   – Parallel-Signature Analysis at Inputs

   – Pseudo-Random Pattern Generation From Outputs

   – Sample Inputs/Toggle Outputs

   – Binary Count From Outputs

   – Device Identification

   – Even-Parity Opcodes

• Package Options Include 64-Pin Plastic

   Thin Shrink Small Outline DGG and 64-Pin

   Ceramic Dual Flat HKC Packages Using

   0.5-mm Center-to-Center Spacings