SN74BCT8245ADWR

八进制总线收发器扫描测试设备 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

description

The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE™ testability integrated circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitryis accomplished via the 4-wire test access port TAP interface.

Members of the Texas Instruments SCOPE™Family of Testability Products

Octal Test-Integrated Circuits

Functionally Equivalent to ’F245 and ’BCT245 in the Normal- Function Mode

Compatible With the IEEE Standard 1149.1-1990 JTAG Test Access Port and Boundary-Scan Architecture

Test Operation Synchronous to Test Access Port TAP

Implement Optional Test Reset Signal by Recognizing a Double-High-Level Voltage 10 V on TMS Pin

SCOPE™Instruction Set

− IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ

− Parallel-Signature Analysis at Inputs

− Pseudo-Random Pattern Generation From Outputs

− Sample Inputs/Toggle Outputs

Package Options Include Plastic Small-Outline DW Packages, Ceramic Chip Carriers FK, and Standard Plastic and Ceramic 300-mil DIPs JT, NT