3.3 -V ABT扫描测试了18位收发器和寄存器的器件 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS
description
The ’LVTH18646A and ’LVTH182646A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port TAP interface.
Additionally, these devices are designed specifically for low-voltage 3.3-V VCC operation, but with the capability to provide a TTL interface to a 5-V system environment.
• Members of the Texas Instruments SCOPE™ Family of Testability Products
• Members of the Texas Instruments Widebus™ Family
• State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation 5-V Input and Output Voltages With 3.3-V VCC
• Support Unregulated Battery Operation Down to 2.7 V
• Include D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data
• Bus Hold on Data Inputs Eliminates the Need for External Pullup/Pulldown Resistors
• B-Port Outputs of ’LVTH182646A Devices Have Equivalent 25-Ω Series Resistors, So No External Resistors Are Required
• Compatible With IEEE Std 1149.1-1990 JTAG Test Access Port and Boundary-Scan Architecture
• SCOPE Instruction Set
– IEEE Std 1149.1-1990 Required Instructions and Optional CLAMP and HIGHZ
– Parallel-Signature Analysis at Inputs
– Pseudo-Random Pattern Generation From Outputs
– Sample Inputs/Toggle Outputs
– Binary Count From Outputs
– Device Identification
– Even-Parity Opcodes
• Packaged in 64-Pin Plastic Thin Quad Flat PM Packages Using 0.5-mm
Center-to-Center Spacings and 68-Pin
Ceramic Quad Flat HV Packages Using
25-mil Center-to-Center Spacings
电源电压DC 2.70V ~ 3.60V
输出接口数 18
通道数 9
位数 18
传送延迟时间 6.00 ns
电压波节 3.30 V, 2.70 V
输出电流驱动 -500 µA
工作温度Max 85 ℃
工作温度Min -40 ℃
电源电压 2.7V ~ 3.6V
电源电压Max 3.6 V
电源电压Min 2.7 V
安装方式 Surface Mount
引脚数 64
封装 LQFP-64
封装 LQFP-64
工作温度 -40℃ ~ 85℃
产品生命周期 Active
包装方式 Tray
RoHS标准 RoHS Compliant
含铅标准 Lead Free
REACH SVHC版本 2015/06/15
型号/品牌 | 代替类型 | 替代型号对比 |
---|---|---|
SN74LVTH18646APM TI 德州仪器 | 当前型号 | 当前型号 |
SN74LVTH18646APMG4 德州仪器 | 类似代替 | SN74LVTH18646APM和SN74LVTH18646APMG4的区别 |
8V18646AIPMREP 德州仪器 | 类似代替 | SN74LVTH18646APM和8V18646AIPMREP的区别 |
V62/04731-01XE 德州仪器 | 类似代替 | SN74LVTH18646APM和V62/04731-01XE的区别 |