与八路缓冲器扫描测试设备 SCAN TEST DEVICES WITH OCTAL BUFFERS
description
The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port TAP interface.
Members of the Texas Instruments SCOPE™Family of Testability Products
Octal Test-Integrated Circuits
Functionally Equivalent to ’F244 and ’BCT244 in the Normal-Function Mode
Compatible With the IEEE Standard 1149.1-1990 JTAG Test Access Port and Boundary-Scan Architecture
Test Operation Synchronous to Test Access Port TAP
Implement Optional Test Reset Signal by Recognizing a Double-High-Level Voltage 10 V on TMS Pin
SCOPE™Instruction Set
− IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP and HIGHZ
− Parallel-Signature Analysis at Inputs
− Pseudo-Random Pattern Generation From Outputs
− Sample Inputs/Toggle Outputs
Package Options Include Plastic Small-Outline DW Packages, Ceramic Chip Carriers FK, and Standard Plastic and Ceramic 300-mil DIPs JT, NT