Spring Contact Probe .100 size 2 centerline spacing waffle
Size 2, 0.100 Centerline, Spring Contact, Test Probe Use Spring Probes to maximize your testing efficiency, Short Stroke Probes are ideal for bare Board testing of conventional or SMT PCBs.
* Tip Style: Serrated
* Maximum Travel: 0.160 4.06 In.mm
* Spring Force: 4.0 Oz. @ 0.100 2.54 In.mm
Allied Electronics:
Spring Contact Probe .100 size 2 centerline spacing waffle
额定电流 3.00 A
长度 24.6 mm
Brand/Series S Series
Centerline, Spacing 0.100 2.54 In.mm In.mm
Contact Resistance 35 Milliohms Max. Milliohms Max.
Current Rating 3 A A
Force, Spring 4.0 Oz. Oz.
Gender Probe
Length, Overall 0.970 In. In.
Material, Barrel Nickel/Silver
Material, Plating Gold Plated Plunger
Material, Plunger Beryllium Copper
Material, Spring Beryllium Copper
Maximum Travel 0.160 In.
Minimum Centers 0.100 In.
Primary Type Probe
Size Size 2
Tip Style H - Serrated 9Pt.
Type Connector Probe
RoHS标准 RoHS Compliant