八进制D类锁存器扫描测试设备 SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
description
The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integrated circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port TAP interface.
Members of the Texas Instruments SCOPEFamily of Testability Products
Octal Test-Integrated Circuits
Functionally Equivalent to ’F373 and ’BCT373 in the Normal-Function Mode
Compatible With the IEEE Standard 1149.1-1990 JTAG Test Access Port and Boundary-Scan Architecture
Test Operation Synchronous to Test Access Port TAP
Implement Optional Test Reset Signal by Recognizing a Double-High-Level Voltage 10 V on TMS Pin
SCOPEInstruction Set
– IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ
– Parallel Signature Analysis at Inputs
– Pseudo-Random Pattern Generation From Outputs
– Sample Inputs/Toggle Outputs
Package Options Include Plastic Small-Outline DW Packages, Ceramic Chip Carriers FK, and Standard Plastic and Ceramic 300-mil DIPs JT, NT
