3.3 -V ABT扫描测试了18位通用总线收发器器件 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
description
The ’LVT18512 and ’LVT182512 scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port TAP interface.
Additionally, these devices are designed specifically for low-voltage 3.3-V VCC operation, but with the capability to provide a TTL interface to a 5-V system environment.
• Members of the Texas Instruments SCOPE™ Family of Testability Products
• Members of the Texas Instruments Widebus™ Family
• State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation 5-V Input and Output Voltages With 3.3-V VCC
• Support Unregulated Battery Operation Down to 2.7 V
• UBT™ Universal Bus Transceiver Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode
• B-Port Outputs of ’LVT182512 Devices Have Equivalent 25-Ω Series Resistors, So No External Resistors Are Required
• Compatible With the IEEE Std 1149.1-1990 JTAG Test Access Port and Boundary-Scan Architecture
• SCOPE™ Instruction Set
– IEEE Std 1149.1-1990 Required Instructions and Optional CLAMP and HIGHZ
– Parallel-Signature Analysis at Inputs
– Pseudo-Random Pattern Generation From Outputs
– Sample Inputs/Toggle Outputs
– Binary Count From Outputs
– Device Identification
– Even-Parity Opcodes
• Package Options Include 64-Pin Plastic
Thin Shrink Small Outline DGG and 64-Pin
Ceramic Dual Flat HKC Packages Using
0.5-mm Center-to-Center Spacings