923650-08概述
3M 923650-08 测试夹,SOIC 8路
* 8-way narrow bodied 0.15" 3.81mm design
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- Designed for testing surface mount, small outline ICs
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- Strong helical springs and insulated contact combs
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- IC pin spacing 0.05" 1.27mm
得捷:
TEST CLIP SOIC 8 2 X 4
e络盟:
测试夹, IC, SOIC, 8 触点, 镀金触芯, 923系列
艾睿:
EIGHtpin Alloy Soic Narrow Surface Mount Test Clip
Allied Electronics:
Conn; Test; Clips; SMT Term; 8 Cont; Alloy Cont Mtl
Chip1Stop:
EIGHtpin Alloy Soic Narrow Surface Mount Test Clip
Newark:
IC Test Clip, SOIC, 8 Contacts, Gold Plated Contacts, 923 Series