数据转换 IC 开发工具 DAC3152 Eval Mod
The is a circuit board that allows designers to evaluate the performance of Texas Instruments dual channel 10bit 500MSPS DAC3152 digital to analog converter DAC with 10byte wide DDR LVDS data input, very low power, size and latency. The evaluation module provides a flexible environment to test the DAC3152 with or without a direct RF TRF370333, a 350MHz to 4.0GHz quadrature modulator, for upconverting I/Q outputs from the DAC to RF. The evaluation module can be used along with the TSW3100 pattern generator card to perform a wide range of tests. The TSW3100 generates the test patterns which are fed to the DAC3152 through an LVDS port. The evaluation module has a clock chip, the CDCP1803, which can be used to synchronize the TSW3100 board to evaluation module.
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- Comprehensive test capability for the DAC3152 for IF and RF outputs
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- Direct connection to TSW3100 pattern generator
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- Includes CDCP1803 for clock generation
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- Includes TRF370333 for complete transmitter evaluation
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- Easy setup software control not required
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- Adapter connector compatible to Xilinx FPGA EVMs with FMC connector
It is important to operate this EVM within the input voltage range of 5V to 7V and the output voltage range of 2.8V to 3.8V. Exceeding the specified input range may cause damage to the EVM.