SN74LVTH18512DGGR

3.3 -V ABT扫描测试了18位通用总线收发器器件 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS

扫描测试通用总线收发器 18 位 64-TSSOP

得捷:
IC SCAN TEST UNIV TXRX 64TSSOP

立创商城:
SN74LVTH18512DGGR

德州仪器TI:
3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers

艾睿:
Bus XCVR Dual 18-CH 3-ST 64-Pin TSSOP T/R

安富利:
Bus XCVR Dual 18-CH 3-ST 64-Pin TSSOP T/R

Chip1Stop:
Bus XCVR Dual 18-CH 3-ST 64-Pin TSSOP T/R

Verical:
Scan Test Device -40C to 85C 64-Pin TSSOP T/R

Newark:
# TEXAS INSTRUMENTS  SN74LVTH18512DGGR  Scan Test Device with Universal Bus Transceivers, 32 mA, 2.7 V to 3.6 V, TSSOP-64

DeviceMart:
IC SCAN TEST UNIV TXRX 64TSSOP

Win Source:
IC SCAN TEST UNIV TXRX 64TSSOP