增强型产品双路输出、低压降稳压器
The dual-voltage regulator offers fast transient response, low dropout LDO voltages, and dual outputs in a compact package and incorporates stability with 10-µF low-ESR output capacitors.
The TPS767D301-EP dual-voltage regulator is designed primarily for DSP applications. This device can be used in any mixed-output voltage application, with each regulator supporting up to 1 A. Dual active-low reset RESET signals allow resetting of core logic and I/O separately.
Because the PMOS device behaves as a low-value resistor, the dropout voltage is very low and is directly proportional to the output current. Additionally, since the PMOS pass element is a voltage-driven device, the quiescent current is very low and independent of output loading typically 85 µA over the full range of output current, 0 mA to 1 A. These two key specifications yield a significant improvement in operating life for battery-powered systems. This LDO device also features a sleep mode; applying a TTL high signal to enable EN shuts down the regulator, reducing the quiescent current to 1 µA at TJ = 25°C.
The RESET output of the TPS767D301-EP initiates a reset in microcomputer and microprocessor systems in the event of an undervoltage condition. An internal comparator in the TPS767D301-EP monitors the output voltage of the regulator to detect an undervoltage condition on the regulated output voltage.
The TPS767D301-EP is offered in an adjustable version programmable over the range of 1.5 V to 5.5 V. Output voltage tolerance is specified as a maximum of 3% over line, load, and temperature ranges. The TPS767D301-EP is available in a 28-pin PWP TSSOP package. The device operates over a junction temperature range of –55°C to 125°C.
Applications
Regulator
200-ms Delay for Each Regulator
Regulator
1 Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test HAST or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified
performance and environmental limits.
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