S-2-H-7-G

S-2-H-7-G概述

INTERCONNECT DEVICES  S-2-H-7-G  弹簧探头, PCB, 华夫格

Size 2, 0.100 Centerline, Spring Contact, Test Probe Use Spring Probes to maximize your testing efficiency, Short Stroke Probes are ideal for bare Board testing of conventional or SMT PCBs.

* Tip Style: Serrated

* Maximum Travel: 0.160 4.06 In.mm

* Spring Force: 7.0 Oz. @ 0.100 2.54 In.mm


e络盟:
# INTERCONNECT DEVICES  S-2-H-7-G  弹簧探头, PCB, 华夫格


Allied Electronics:
Spring Contact Probe .100 size 2 centerline spacing waffle


Newark:
# INTERCONNECT DEVICES  S-2-H-7-G  SPRING CONTACT PROBE, PCB


S-2-H-7-G数据文档
型号 品牌 下载
S-2-H-7-G

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S-2-H-10-G

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S-2-A-4-G

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S-2-A-7-G

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S-2-H-4-G

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S-2-B-4-G

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S-2-D-4-G

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S-2-E-4-G

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S-2-G-4-G

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S-2-B-8.3-G

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S-2-F-4-G

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