S-2-B-7-G

S-2-B-7-G概述

INTERCONNECT DEVICES  S-2-B-7-G  弹簧探头, PCB, 30°尖头

Size 2, 0.100 Centerline, Spring Contact, Test Probe Use Spring Probes to maximize your testing efficiency, Short Stroke Probes are ideal for bare Board testing of conventional or SMT PCBs.

* Tip Style: Spear Tip

* Maximum Travel: 0.160 4.06 In.mm

* Spring Force: 7.0 Oz. @ 0.100 2.54 In.mm


e络盟:
# INTERCONNECT DEVICES  S-2-B-7-G  弹簧探头, PCB, 30°尖头


Allied Electronics:
Spring Contact Probe .100 size 2 centerline spacing 30 degree spear


S-2-B-7-G数据文档
型号 品牌 下载
S-2-B-7-G

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