S-2-E-4-G

S-2-E-4-G概述

INTERCONNECT DEVICES  S-2-E-4-G  弹簧探头, PCB

Size 2, 0.100 Centerline, Spring Contact, Test Probe Use Spring Probes to maximize your testing efficiency, Short Stroke Probes are ideal for bare Board testing of conventional or SMT PCBs.

* Tip Style: Convex Tip

* Maximum Travel: 0.160 4.06 In.mm

* Spring Force: 4.0 Oz. @ 0.100 2.54 In.mm


e络盟:
# INTERCONNECT DEVICES  S-2-E-4-G  弹簧探头, PCB


Allied Electronics:
Spring Contact Probe .100 size 2 centerline spacing 90 degree convex


Newark:
# INTERCONNECT DEVICES  S-2-E-4-G  SPRING CONTACT PROBE, PCB


S-2-E-4-G数据文档
型号 品牌 下载
S-2-E-4-G

IDIInterconnect Devices

下载
S-2-H-10-G

IDIInterconnect Devices

下载
S-2-A-4-G

IDIInterconnect Devices

下载
S-2-A-7-G

IDIInterconnect Devices

下载
S-2-H-4-G

IDIInterconnect Devices

下载
S-2-H-7-G

IDIInterconnect Devices

下载
S-2-B-4-G

IDIInterconnect Devices

下载
S-2-D-4-G

IDIInterconnect Devices

下载
S-2-G-4-G

IDIInterconnect Devices

下载
S-2-B-8.3-G

IDIInterconnect Devices

下载
S-2-F-4-G

IDIInterconnect Devices

下载

锐单商城 - 一站式电子元器件采购平台