SNJ54BCT8240AFK

八进制反相缓冲器扫描测试设备 SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS

description

The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port TAP interface.

In the normal mode, these devices are functionally equivalent to the ’F240 and ’BCT240 octal buffers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPE octal buffers.

• Members of the Texas Instruments SCOPE™ Family of Testability Products

• Octal Test-Integrated Circuits

• Functionally Equivalent to ’F240 and ’BCT240 in the Normal-Function Mode

• Compatible With the IEEE Standard 1149.1-1990 JTAG Test Access Port and Boundary-Scan Architecture

• Test Operation Synchronous to Test Access Port TAP

• Implement Optional Test Reset Signal by Recognizing a Double-High-Level Voltage 10 V on TMS Pin

• SCOPE™ Instruction Set

   – IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ

   – Parallel-Signature Analysis at Inputs

   – Pseudo-Random Pattern Generation From Outputs

   – Sample Inputs/Toggle Outputs

• Package Options Include Plastic

   Small-Outline DW Packages, Ceramic Chip Carriers FK, and Standard Plastic and Ceramic 300-mil DIPs JT, NT