923650-08

923650-08概述

3M  923650-08  测试夹,SOIC 8路

* 8-way narrow bodied 0.15" 3.81mm design

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Designed for testing surface mount, small outline ICs
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Strong helical springs and insulated contact combs
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IC pin spacing 0.05" 1.27mm

得捷:
TEST CLIP SOIC 8 2 X 4


e络盟:
测试夹, IC, SOIC, 8 触点, 镀金触芯, 923系列


艾睿:
EIGHtpin Alloy Soic Narrow Surface Mount Test Clip


Allied Electronics:
Conn; Test; Clips; SMT Term; 8 Cont; Alloy Cont Mtl


Chip1Stop:
EIGHtpin Alloy Soic Narrow Surface Mount Test Clip


Newark:
IC Test Clip, SOIC, 8 Contacts, Gold Plated Contacts, 923 Series


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