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IC EMC(集成电路电磁兼容)测试标准介绍

IEC汇总标准委员会国际标准类型

IEC 61967 Integrated circuits–Measurement of electromagnetic emissions, 150 kHz to 1 GHz(电磁发射标准系列)

Part 1:General conditions and definitions

Part 2:Measurement of radiated emissions –TEM cell and wideband TEM cell method

Part 3-TS:Measurement of radiated emissions –Surface scan method

Part 4:Measurement of conducted emissions –1 Ω/150 Ω direct coupling method

Part 4-1-TR:Application guidance to IEC 61967-4

Part 5:Measurement of conducted emissions –Workbench Faraday Cage method

Part 6: Measurement of conducted emissions –Magnetic probe method

Part 8: Measurement of radiated emissions - IC stripline method

IEC 62132 Integrated circuits–Measurement of electromagnetic immunity, 150 kHz to 1 GHz (电磁抗扰度标准系列)

Part 1:General conditions and definitions

Part 2: Measurement of Radiated Immunity - TEM Cell and Wideband

TEM Cell Method

Part 3: Bulk current injection (BCI) method

Part 4:Direct RF power injection method

Part 5:Workbench Faraday cage method

Part 8: Measurement of radiated immunity - IC stripline method

Part 9-TS: Measurement of radiated immunity - Surface scan method

IEC 62215 Integrated circuits–Measurement of impulse immunity(脉冲抗扰度标准-EFT和surge)

Part 3: Non-synchronous transient injection method

Part 2: synchronous transient injection method

EMC随着我国芯片开发过程中的测试,IC相信这个方向在行业内会越来越受到重视!

标签: rf7170集成电路ic

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