接口 - 专用 Enhanced SCAN Bridge Multidrop Port
The SCANSTA111 extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a multidrop approach over a single serial scan chain is improved test throughput and the ability to remove a board from the system and retain test access to the remaining modules. Each SCANSTA111 supports up to 3 local IEEE 1149.1 scan rings which can be accessed individually or combined serially. Addressing is accomplished by loading the instruction register with a value matching that of the Slot inputs. Backplane and inter-board testing can easily be accomplished by parking the local TAP Controllers in one of the stable TAP Controller states via a Park instruction. The 32-bit TCK counter enables built in self test operations to be performed on one port while other scan chains are simultaneously tested.
型号 | 品牌 | 下载 |
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SCANSTA111SM/NOPB | TI 德州仪器 | 下载 |
SCAN90CP02SP/NOPB | TI 德州仪器 | 下载 |
SCAN90CP02VY/NOPB | TI 德州仪器 | 下载 |
SCANPSC110FSCX | Fairchild 飞兆/仙童 | 下载 |
SCANPSC110FSC | Fairchild 飞兆/仙童 | 下载 |
SCAN162602SM/NOPB | TI 德州仪器 | 下载 |
SCANH162602SM/NOPB | TI 德州仪器 | 下载 |
SCAN182245ASSC | Fairchild 飞兆/仙童 | 下载 |
SCAN18245TSSCX | Fairchild 飞兆/仙童 | 下载 |
SCAN182245AMTDX | Fairchild 飞兆/仙童 | 下载 |
SCAN162512ASM/NOPB | TI 德州仪器 | 下载 |