SN74BCT8244ADW

TEXAS INSTRUMENTS  SN74BCT8244ADW  扫描测试设备, 8路缓冲器, 4.5 V至5.5 V, SOIC-24

74BCT 系列，Texas Instruments

BiCMOS TTL 逻辑

工作电压：4.5 至 5.5

兼容性：输入 LVTTL/TTL、输出 TTL

立创商城:
SN74BCT8244ADW

德州仪器TI:
IEEE Std 1149.1 JTAG Boundary-Scan Test Device With Octal Buffers

欧时:
Texas Instruments SN74BCT8244ADW BCT 系列 8位 三态 非反相 缓冲器，线路驱动器, 24引脚 SOIC封装

得捷:
IC SCAN TEST DEVICE BUFF 24-SOIC

e络盟:
TEXAS INSTRUMENTS  SN74BCT8244ADW  扫描测试设备, 8路缓冲器, 4.5 V至5.5 V, SOIC-24

艾睿:
Amplify analog and digital signals by driving the input to the transmission line with this SN74BCT8244ADW buffer and line driver from Texas Instruments. With a 3-state output, this is power management at its best. This line driver has an operating temperature range of 0 °C to 70 °C. This device comes in tube packaging. It has 8 channels per chip. This non-inverting device has a typical operating supply voltage of 5 V. Its minimum operating supply voltage of 4.5 V, while its maximum is 5.5 V.

安富利:
Scan Buffer/Line Driver 8-CH Non-Inverting 3-ST BiCMOS 24-Pin SOIC Tube

Chip1Stop:
Scan Buffer/Line Driver 8-CH Non-Inverting 3-ST BiCMOS 24-Pin SOIC Tube

Verical:
Scan Buffer/Line Driver 8-CH Non-Inverting 3-ST BiCMOS 24-Pin SOIC Tube

Newark:
# TEXAS INSTRUMENTS  SN74BCT8244ADW  LOGIC, SCAN TEST DEVICE BUFF, 24SOIC

Win Source:
IC SCAN TEST DEVICE BUFF 24-SOIC